Atomic-scale chemical mapping of copper dopants in Bi2Te2.7Se0.3 thermoelectric alloy

Title
Atomic-scale chemical mapping of copper dopants in Bi2Te2.7Se0.3 thermoelectric alloy
Authors
Keywords
Excess Cu doping, Bi, 2, Te, 2·7, Se, 0.3, STEM-EDX spectrum Imaging, Atomic scale mapping, Transport properties
Journal
Materials Today Physics
Volume -, Issue -, Pages 100347
Publisher
Elsevier BV
Online
2021-01-22
DOI
10.1016/j.mtphys.2021.100347

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