4.8 Article

Single artificial atoms in silicon emitting at telecom wavelengths

Journal

NATURE ELECTRONICS
Volume 3, Issue 12, Pages 738-+

Publisher

NATURE RESEARCH
DOI: 10.1038/s41928-020-00499-0

Keywords

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Funding

  1. French National Research Agency (ANR) through the PRCI project ULYSSES [ANR-15-CE24-0027-01]
  2. French National Research Agency (ANR) through the PRCI project OCTOPUS [ANR-18-CE47-0013-01]
  3. German Research Foundation (DFG) through the ULYSSES project
  4. European Union's Horizon 2020 research and innovation programme through the FET-OPEN project NARCISO [828890]
  5. GENCI [6107]
  6. French DGA
  7. Agence Nationale de la Recherche (ANR) [ANR-18-CE47-0013] Funding Source: Agence Nationale de la Recherche (ANR)

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Carbon-related point defects can be isolated in a commercial silicon-on-insulator wafer, acting as artificial atoms that provide efficient polarized single-photon emission at wavelengths suitable for long-distance propagation in optical fibres. Given its potential for integration and scalability, silicon is likely to be a key platform for large-scale quantum technologies. Individual electron-encoded artificial atoms, formed by either impurities or quantum dots, have emerged as a promising solution for silicon-based integrated quantum circuits. However, single qubits featuring an optical interface, which is needed for long-distance exchange of information, have not yet been isolated in silicon. Here we report the isolation of single optically active point defects in a commercial silicon-on-insulator wafer implanted with carbon atoms. These artificial atoms exhibit a bright, linearly polarized single-photon emission with a quantum efficiency of the order of unity. This single-photon emission occurs at telecom wavelengths suitable for long-distance propagation in optical fibres. Our results show that silicon can accommodate single isolated optical point defects like in wide-bandgap semiconductors, despite a small bandgap (1.1 eV) that is unfavourable for such observations.

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