Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure

Title
Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure
Authors
Keywords
-
Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 54, Issue 1, Pages -
Publisher
International Union of Crystallography (IUCr)
Online
2020-12-03
DOI
10.1107/s1600576720014016

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