Validity of Machine Learning in the Quantitative Analysis of Complex Scanning Near-Field Optical Microscopy Signals Using Simulated Data
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Title
Validity of Machine Learning in the Quantitative Analysis of Complex Scanning Near-Field Optical Microscopy Signals Using Simulated Data
Authors
Keywords
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Journal
Physical Review Applied
Volume 15, Issue 1, Pages -
Publisher
American Physical Society (APS)
Online
2021-01-05
DOI
10.1103/physrevapplied.15.014001
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