Symmetry prediction and knowledge discovery from X-ray diffraction patterns using an interpretable machine learning approach

Title
Symmetry prediction and knowledge discovery from X-ray diffraction patterns using an interpretable machine learning approach
Authors
Keywords
-
Journal
Scientific Reports
Volume 10, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2020-12-11
DOI
10.1038/s41598-020-77474-4

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started