Laser ablation sample preparation for atom probe tomography and transmission electron microscopy

Title
Laser ablation sample preparation for atom probe tomography and transmission electron microscopy
Authors
Keywords
Laser ablation, Atom probe tomography, Transmission electron microscopy, Silicon wafers, Pure aluminium, Damage characterisation
Journal
ULTRAMICROSCOPY
Volume 220, Issue -, Pages 113161
Publisher
Elsevier BV
Online
2020-11-03
DOI
10.1016/j.ultramic.2020.113161

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