Evolution of the Electronic Properties of ZrX2 (X = S, Se, or Te) Thin Films under Varying Thickness

Published 2021 View Full Article

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Title
Evolution of the Electronic Properties of ZrX2 (X = S, Se, or Te) Thin Films under Varying Thickness
Authors
Keywords
-
Journal
Journal of Physical Chemistry C
Volume 125, Issue 1, Pages 1134-1142
Publisher
American Chemical Society (ACS)
Online
2021-01-05
DOI
10.1021/acs.jpcc.0c10085

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