High temperature dielectric stable (1-x)[(Na0.5Bi0.5)0.92Ba0.08]0.955La0.03TiO3-xNaNbO3 system with ultra-low dielectric loss range through optimizing the defect chemistry

Title
High temperature dielectric stable (1-x)[(Na0.5Bi0.5)0.92Ba0.08]0.955La0.03TiO3-xNaNbO3 system with ultra-low dielectric loss range through optimizing the defect chemistry
Authors
Keywords
High temperature capacitors, Na, 1/2, Bi, 1/2, TiO, 3, -BaTiO, 3, Dielectric loss, Temperature stability, Defect chemistry
Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 846, Issue -, Pages 156308
Publisher
Elsevier BV
Online
2020-07-09
DOI
10.1016/j.jallcom.2020.156308

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