4.6 Article Proceedings Paper

A 13-bit 0.005-mm2 40-MS/s SAR ADC With kT/C Noise Cancellation

Journal

IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume 55, Issue 12, Pages 3260-3270

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2020.3016656

Keywords

Amplifier noise; analog-to-digital converter (ADC); comparator preamp; input driver; kT/C noise cancellation; reference buffer; sampling noise; successive approximation register (SAR)

Funding

  1. NSFC [61904094, 61934009]
  2. China Postdoctoral Science Foundation [2020M670329]
  3. Beijing National Research Center for Information Science and Technology
  4. Beijing Innovation Center for Future Chip

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As any analog-to-digital converter ( ADC) with a front-end sample-and-hold (S/H) circuit, successive approximation register (SAR) ADC suffers from a fundamental signalto-noise ratio (SNR) challenge: its sampling kT/C noise. To satisfy the SNR requirement, the input capacitor size has to be sufficiently large, leading to a great burden for the design of the ADC input driver and reference buffer. This article presents an SAR ADC with a kT/C noise-cancellation technique. It enables the substantial reduction of ADC input capacitor size but without the large kT/C noise penalty. It greatly relaxes the requirement for ADC input driver and reference buffer. Built in 40-nm CMOS, a prototype 13-bit ADC has only 240-fF input capacitance and occupies a small area of 0.005 mm(2). Operating at 40 MS/s, it achieves a 69-dB signal-to-noise-and-distortion ratio (SNDR) across the Nyquist frequency band while consuming 591 mu W of power.

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