Interfacial bonding of CuZr metallic glass via oxide: A molecular dynamics study

A layer of oxygen is introduced into a Cu64Zr36 MG to achieve interfacial bonding. The oxidation kinetics, diffusion behavior, local structure, and mechanical performance of the oxide-bonded MG were investigated via molecular dynamics simulations. The growth of the oxide layer follows the inverse-logarithmic law, indicating that this process is controlled by the ionic drift through the oxide in response to electric fields. The introduction of oxygen atoms seriously deteriorates the short-range ordering of MG by suppressing the formation of icosahedral clusters. Uniaxial tensile tests indicate that the oxide-bonded MG has favorable ductility, while its ultimate tensile strength is reduced.

Automated summary

Introducing a layer of oxygen into Cu64Zr36 MG for interfacial bonding controlled by ionic drift through the oxide, and deteriorating short-range ordering of MG, while uniaxial tensile tests show favorable ductility with reduced ultimate tensile strength.