Identifying Defect-Induced Trion in Monolayer WS2 via Carrier Screening Engineering

Published 2021 View Full Article

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Title
Identifying Defect-Induced Trion in Monolayer WS2 via Carrier Screening Engineering
Authors
Keywords
-
Journal
ACS Nano
Volume -, Issue -, Pages -
Publisher
American Chemical Society (ACS)
Online
2021-01-20
DOI
10.1021/acsnano.0c08828

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