Using Fourier-Plane Imaging Microscopy for Determining Transition-Dipole-Moment Orientations in Organic Light-Emitting Devices
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Title
Using Fourier-Plane Imaging Microscopy for Determining Transition-Dipole-Moment Orientations in Organic Light-Emitting Devices
Authors
Keywords
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Journal
Physical Review Applied
Volume 14, Issue 3, Pages -
Publisher
American Physical Society (APS)
Online
2020-09-17
DOI
10.1103/physrevapplied.14.034048
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