Thickness effect on the stability of unipolar resistance switching in tin ferrite thin films

Published 2016 View Full Article

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Title
Thickness effect on the stability of unipolar resistance switching in tin ferrite thin films
Authors
Keywords
RRAM, Amorphous, SnFe, 2, O, 4, Forming voltage, Stability
Journal
CURRENT APPLIED PHYSICS
Volume 16, Issue 9, Pages 980-984
Publisher
Elsevier BV
Online
2016-05-27
DOI
10.1016/j.cap.2016.05.020

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