Power optimized SRAM cell with high radiation hardened for aerospace applications

Title
Power optimized SRAM cell with high radiation hardened for aerospace applications
Authors
Keywords
High speed, Readability, Recovery, Statistical analysis, Soft errors, Writability
Journal
MICROELECTRONICS JOURNAL
Volume 103, Issue -, Pages 104843
Publisher
Elsevier BV
Online
2020-08-03
DOI
10.1016/j.mejo.2020.104843

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