Study of local structure around Bi in topological insulating materials (Bi1-xSbx)2Te3 using extended x-ray absorption fine structure technique

Published 2020 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Study of local structure around Bi in topological insulating materials (Bi1-xSbx)2Te3 using extended x-ray absorption fine structure technique
Authors
Keywords
Topological insulators, Quintuple layers, XANES, EXAFS
Journal
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
Volume -, Issue -, Pages 109834
Publisher
Elsevier BV
Online
2020-10-25
DOI
10.1016/j.jpcs.2020.109834

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.