Complete Avalanche Process and Failure Mechanism of Trench-Gate FS-IGBT Under Unclamped Inductive Switching by Using Infrared Visualization Method

Published 2020 View Full Article

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Title
Complete Avalanche Process and Failure Mechanism of Trench-Gate FS-IGBT Under Unclamped Inductive Switching by Using Infrared Visualization Method
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 67, Issue 9, Pages 3908-3911
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2020-08-05
DOI
10.1109/ted.2020.3011644

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