Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions

Published 2020 View Full Article

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Title
Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 67, Issue 9, Pages 3729-3735
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2020-08-05
DOI
10.1109/ted.2020.3011398

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