X-ray orientation microscopy using topo-tomography and multi-mode diffraction contrast tomography

Title
X-ray orientation microscopy using topo-tomography and multi-mode diffraction contrast tomography
Authors
Keywords
X-ray diffraction imaging, X-ray orientation microscopy, Polycrystal orientation mapping, Topotomography, X-ray diffraction contrast tomography
Journal
Publisher
Elsevier BV
Online
2020-08-31
DOI
10.1016/j.cossms.2020.100832

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now