Large-Scale characterization of Two-Dimensional Monolayer MoS2 Island Domains Using Spectroscopic Ellipsometry and Reflectometry

Published 2020 View Full Article

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Title
Large-Scale characterization of Two-Dimensional Monolayer MoS2 Island Domains Using Spectroscopic Ellipsometry and Reflectometry
Authors
Keywords
2D materials, Spectroscopic Ellipsometry, Inhomogeneous film, Island-film model, Large-scale characterization
Journal
APPLIED SURFACE SCIENCE
Volume 524, Issue -, Pages 146418
Publisher
Elsevier BV
Online
2020-05-04
DOI
10.1016/j.apsusc.2020.146418

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