Journal
APPLIED PHYSICS LETTERS
Volume 117, Issue 14, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0023778
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Funding
- Air Force Office of Scientific Research [FA9550-18-1-0507]
- II-VI foundation Block Gift Program
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In this work, we report on the growth of high-mobility beta-Ga2O3 homoepitaxial thin films grown at a temperature much lower than the conventional growth temperature window for metalorganic vapor phase epitaxy. Low-temperature beta-Ga2O3 thin films grown at 600 degrees C on Fe-doped (010) bulk substrates exhibit remarkable crystalline quality, which is evident from the measured room temperature Hall mobility of 186cm(2)/Vs for the unintentionally doped films. N-type doping is achieved by using Si as a dopant, and a controllable doping in the range of 2x10(16)-2x10(19)cm(-3) is studied. Si incorporation and activation is studied by comparing the silicon concentration from secondary ion mass spectroscopy and the electron concentration from temperature-dependent Hall measurements. The films exhibit high purity (low C and H concentrations) with a very low concentration of compensating acceptors (2x10(15)cm(-3)) even at this growth temperature. Additionally, an abrupt doping profile with a forward decay of similar to 5nm/dec (10 times improvement compared to what is observed for thin films grown at 810 degrees C) is demonstrated by growing at a lower temperature.
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