Benchmarking near-term devices with quantum error correction

Title
Benchmarking near-term devices with quantum error correction
Authors
Keywords
-
Journal
Quantum Science and Technology
Volume 5, Issue 4, Pages 044004
Publisher
IOP Publishing
Online
2020-06-27
DOI
10.1088/2058-9565/aba038

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started