4.3 Article

Tuned and screened range-separated hybrid density functional theory for describing electronic and optical properties of defective gallium nitride

Journal

PHYSICAL REVIEW MATERIALS
Volume 4, Issue 6, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevMaterials.4.063803

Keywords

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Funding

  1. U S Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES) Early Career Program [DE-SC0018080]
  2. Office of Science of the US Department of Energy [DE-AC02-05CH11231]
  3. Extreme Science and Engineering Discovery Environment (XSEDE) - National Science Foundation [ACI1548562]
  4. Boston University Scientific Computing Center at the Massachusetts Green High-Performance Computing Center (MGHPCC)

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We apply a hybrid density functional theory approach, based on a tuned and screened range-separated hybrid (SRSH) exchange-correlation functional, to describe the optoelectronic properties of defective gallium nitride (GaN). SRSH and time-dependent SRSH (TDSRSH) are tuned to produce accurate energetics for the pristine material and applied to the study of a series of point defects in bulk GaN, a blue light-emitting material that degrades in the presence of defects. We first establish the accuracy of the method by comparing the predicted quasiparticle gap and low-energy excitation spectra of (TD)SRSH and many-body perturbation theory for both pristine GaN and GaN containing a single nitrogen vacancy. Aided by the reduced computational cost of (TD)SRSH, we then report on three additional technologically relevant point defects and defect complexes in GaN: the gallium vacancy, the carbon interstitial, and the carbon-silicon complex. We compute the low-energy optical absorption spectra for these defects and show the presence of defect-centered transitions. Furthermore, by estimating the Stokes shift, we predict, in agreement with previous studies, that the carbon substitutional defect is a candidate for the detrimental yellow luminescence in GaN. This study indicates that TDSRSH is a promising and computationally feasible approach for quantitatively accurate, first-principles modeling of defective semiconductors.

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