Sequential Pattern Mining of Longitudinal Adverse Events After Left Ventricular Assist Device Implant

Title
Sequential Pattern Mining of Longitudinal Adverse Events After Left Ventricular Assist Device Implant
Authors
Keywords
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Journal
IEEE Journal of Biomedical and Health Informatics
Volume 24, Issue 8, Pages 2347-2358
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-12-10
DOI
10.1109/jbhi.2019.2958714

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