Controllable surface contact resistance in solution-processed thin film transistors due to dimension modification

Title
Controllable surface contact resistance in solution-processed thin film transistors due to dimension modification
Authors
Keywords
-
Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume -, Issue -, Pages -
Publisher
IOP Publishing
Online
2020-07-17
DOI
10.1088/1361-6641/aba6df

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