Defect tolerant zero-bias topological photocurrent in a ferroelectric semiconductor

Title
Defect tolerant zero-bias topological photocurrent in a ferroelectric semiconductor
Authors
Keywords
-
Publisher
Proceedings of the National Academy of Sciences
Online
2020-08-11
DOI
10.1073/pnas.2007002117

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started