Journal
NANOTECHNOLOGY
Volume 31, Issue 43, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1361-6528/aba39f
Keywords
semiconductor core-shell nanoplatelets; single-layer electrostatic deposition; spectroscopic ellipsometry; refractive index
Funding
- Institute of Physics Belgrade, through the Ministry of Education, Science, and Technological Development of the Republic of Serbia
- Qatar National Research Fund [NPRP11S-1126-170033]
- CHEMREAGENTS program
- Science Fund of the Republic of Serbia [6062710]
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Semiconductor CdSe/CdS core-shell nanoplatelets exhibit narrow and intense absorption and photoluminescence spectra in the visible range, which makes them suitable for numerous applications in optoelectronics. Of particular interest is the preparation and optical characterization of thin films with an accurately controlled amount of nanoplatelets. Here we report on the use of spectroscopic ellipsometry for investigating the optical properties of ultrathin films composed of a single layer of negatively charged CdSe/CdS core-shell nanoplatelets prepared by the electrostatic layer-by-layer deposition on SiO2/Si substrates. Combining the ellipsometric spectra with atomic force microscopy measurements, we were able to infer the nanoplatelet film extinction spectra which was found to exhibit the two characteristic exciton peaks albeit blueshifted relative to the colloidal nanoplatelets.
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