Optimal STEM Convergence Angle Selection Using a Convolutional Neural Network and the Strehl Ratio

Improving electron micrograph signal-to-noise with an atrous convolutional encoder-decoder

(2019) Jeffrey M. Ede et al.   ULTRAMICROSCOPY

Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks

(2019) Chenyu Zhang et al.   ULTRAMICROSCOPY

Fine tuning an aberration corrected ADF-STEM

(2018) Earl J. Kirkland   ULTRAMICROSCOPY

A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns

(2018) W. Xu et al.   ULTRAMICROSCOPY

Dr. Probe: A software for high-resolution STEM image simulation

(2018) J. Barthel   ULTRAMICROSCOPY

SegNet: A Deep Convolutional Encoder-Decoder Architecture for Image Segmentation

(2017) Vijay Badrinarayanan et al.   IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE

Deep learning

(2015) Yann LeCun et al.   NATURE

Adaptive optics correction of specimen-induced aberrations in single-molecule switching microscopy

(2015) Daniel Burke et al.   Optica

On the optimum probe in aberration corrected ADF-STEM

(2011) Earl J. Kirkland   ULTRAMICROSCOPY

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

(2010) T. Sasaki et al.   Microscopy

Aberration measurement using the Ronchigram contrast transfer function

(2010) A.R. Lupini et al.   ULTRAMICROSCOPY

Measurement of effective source distribution and its importance for quantitative interpretation of STEM images

(2010) C. Dwyer et al.   ULTRAMICROSCOPY

Measurement method of aberration from Ronchigram by autocorrelation function

(2008) H. Sawada et al.   ULTRAMICROSCOPY