High-Resolution STEM/STEM-EELS Characterization of Entropy-stabilized Oxides Thin Films

Published 2020 View Full Article

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Title
High-Resolution STEM/STEM-EELS Characterization of Entropy-stabilized Oxides Thin Films
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume -, Issue -, Pages 1-3
Publisher
Cambridge University Press (CUP)
Online
2020-07-31
DOI
10.1017/s1431927620017304

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