Modeling of the finite boundary limit of evaporation flux in the contact line region using the surface plasmon resonance imaging

Title
Modeling of the finite boundary limit of evaporation flux in the contact line region using the surface plasmon resonance imaging
Authors
Keywords
Evaporating thin film (ETF), Diffusion-limited model, Evaporation flux, Surface plasmon resonance imaging (SPRi), Contact line region, Finite boundary limit, Average evaporation flux (AEF)
Journal
Publisher
Elsevier BV
Online
2020-05-31
DOI
10.1016/j.icheatmasstransfer.2020.104598

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