An automatic method based on daily in situ images and deep learning to date wheat heading stage

Published 2020 View Full Article

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Title
An automatic method based on daily in situ images and deep learning to date wheat heading stage
Authors
Keywords
Phenology, Internet of Things for Agriculture, Convolutional neural networks, Field sensors, Phenology modelling
Journal
FIELD CROPS RESEARCH
Volume 252, Issue -, Pages 107793
Publisher
Elsevier BV
Online
2020-04-13
DOI
10.1016/j.fcr.2020.107793

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