Microstructure and texture of polycrystalline 3C–SiC thick films characterized via EBSD

Published 2020 View Full Article

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Title
Microstructure and texture of polycrystalline 3C–SiC thick films characterized via EBSD
Authors
Keywords
3C–SiC, Preferred orientation, Thick film, EBSD, Growth mechanism
Journal
CERAMICS INTERNATIONAL
Volume -, Issue -, Pages -
Publisher
Elsevier BV
Online
2020-07-21
DOI
10.1016/j.ceramint.2020.07.177

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