Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy
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Title
Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy
Authors
Keywords
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Journal
Beilstein Journal of Nanotechnology
Volume 11, Issue -, Pages 443-449
Publisher
Beilstein Institut
Online
2020-03-10
DOI
10.3762/bjnano.11.35
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- Mechanical Properties of Various Phases on In/Si(111) Surfaces Revealed by Atomic Force Microscopy
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- (2013) Teng-Yuan Chang et al. NANO LETTERS
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- Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe
- (2012) Adam Sweetman et al. Beilstein Journal of Nanotechnology
- VESTA 3for three-dimensional visualization of crystal, volumetric and morphology data
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- Theoretical analysis of small Pt particles on rutileTiO2(110)surfaces
- (2010) Veysel Çelik et al. PHYSICAL REVIEW B
- The electronic structure of oxygen atom vacancy and hydroxyl impurity defects on titanium dioxide (110) surface
- (2009) Taketoshi Minato et al. JOURNAL OF CHEMICAL PHYSICS
- Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of theTiO2(110)surface
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- Direct Imaging of Reconstructed Atoms on TiO2 (110) Surfaces
- (2008) N. Shibata et al. SCIENCE
- TiO2 photocatalysis and related surface phenomena
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