4.6 Article

Direct determination of aberration functions in microscopy by an artificial neural network

Journal

OPTICS EXPRESS
Volume 28, Issue 10, Pages 14511-14521

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Optica Publishing Group
DOI: 10.1364/OE.390856

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Adaptive optics relies on the fast and accurate determination of aberrations but is often hindered by wavefront sensor limitations or lengthy optimization algorithms. Deep learning by artificial neural networks has recently been shown to provide determination of aberration coefficients from various microscope metrics. Here we numerically investigate the direct determination of aberration functions in the pupil plane of a high numerical aperture microscope using an artificial neural network. We show that an aberration function can be determined from fluorescent guide stars and used to improve the Strehl ratio without the need for reconstruction from Zernike polynomial coefficients. (c) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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