Wide-field high-resolution 3D microscopy with Fourier ptychographic diffraction tomography

Published 2020 View Full Article

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Title
Wide-field high-resolution 3D microscopy with Fourier ptychographic diffraction tomography
Authors
Keywords
Fourier ptychographic diffraction tomography, Three-dimensional microscopy, Phase retrieval, Refractive index
Journal
OPTICS AND LASERS IN ENGINEERING
Volume 128, Issue -, Pages 106003
Publisher
Elsevier BV
Online
2020-01-28
DOI
10.1016/j.optlaseng.2020.106003

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