Rapid Identification of X-ray Diffraction Patterns Based on Very Limited Data by Interpretable Convolutional Neural Networks

Title
Rapid Identification of X-ray Diffraction Patterns Based on Very Limited Data by Interpretable Convolutional Neural Networks
Authors
Keywords
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Journal
Journal of Chemical Information and Modeling
Volume 60, Issue 4, Pages 2004-2011
Publisher
American Chemical Society (ACS)
Online
2020-03-26
DOI
10.1021/acs.jcim.0c00020

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