Improved measurement of electric fields by nanobeam precession electron diffraction

Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and application

(2018) Victor Boureau et al.   ULTRAMICROSCOPY

Electron ptychography of 2D materials to deep sub-ångström resolution

(2018) Yi Jiang et al.   NATURE

Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy.

(2018) Benedikt Haas et al.   ULTRAMICROSCOPY

Characterisation of the Medipix3 detector for 60 and 80 keV electrons

(2017) J.A. Mir et al.   ULTRAMICROSCOPY

Off-axis electron holography for the measurement of active dopants in silicon semiconductor devices

(2016) David Cooper   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast

(2016) Matus Krajnak et al.   ULTRAMICROSCOPY

Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction

(2015) David Cooper et al.   NANO LETTERS

Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

(2015) Naoya Shibata et al.   Scientific Reports

Improved strain precision with high spatial resolution using nanobeam precession electron diffraction

(2013) Jean-Luc Rouviere et al.   APPLIED PHYSICS LETTERS

Experimental off-axis electron holography of focused ion beam-prepared Si p-n junctions with different dopant concentrations

(2008) David Cooper et al.   JOURNAL OF APPLIED PHYSICS