Vacancy-modulated self-rectifying characteristics of NiOx/Al2O3-based nanoscale ReRAM devices

Published 2019 View Full Article

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Title
Vacancy-modulated self-rectifying characteristics of NiOx/Al2O3-based nanoscale ReRAM devices
Authors
Keywords
ReRAM, Self-rectifying, Vacancy modulation, Forming-free, Nickel oxide, Aluminium oxide
Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 821, Issue -, Pages 153247
Publisher
Elsevier BV
Online
2019-12-03
DOI
10.1016/j.jallcom.2019.153247

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