A System to Measure the Dynamic On‑Resistance of On‑Wafer 600 V Normally-Off GaN HEMTs in Hard Switching Application Conditions

Published 2020 View Full Article

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Title
A System to Measure the Dynamic On‑Resistance of On‑Wafer 600 V Normally-Off GaN HEMTs in Hard Switching Application Conditions
Authors
Keywords
-
Journal
IET Power Electronics
Volume -, Issue -, Pages -
Publisher
Institution of Engineering and Technology (IET)
Online
2020-04-30
DOI
10.1049/iet-pel.2019.1455

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