Multibit Decentralized Detection Through Fusing Smart and Dumb Sensors Based on Rao Test

Title
Multibit Decentralized Detection Through Fusing Smart and Dumb Sensors Based on Rao Test
Authors
Keywords
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Journal
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-08-23
DOI
10.1109/taes.2019.2936777

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