Reliable and efficient PUF-based cryptographic key generator using bit self-tests

Title
Reliable and efficient PUF-based cryptographic key generator using bit self-tests
Authors
Keywords
-
Journal
ELECTRONICS LETTERS
Volume -, Issue -, Pages -
Publisher
Institution of Engineering and Technology (IET)
Online
2020-05-15
DOI
10.1049/el.2020.0344

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