Sub-Angstrom Characterization of the Structural Origin for High In-Plane Anisotropy in 2D GeS2

Published 2020 View Full Article

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Title
Sub-Angstrom Characterization of the Structural Origin for High In-Plane Anisotropy in 2D GeS2
Authors
Keywords
-
Journal
ACS Nano
Volume 14, Issue 4, Pages 4456-4462
Publisher
American Chemical Society (ACS)
Online
2020-04-11
DOI
10.1021/acsnano.9b10057

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