4.8 Article

Determining In-Plane Carrier Diffusion in Two-Dimensional Perovskite Using Local Time-Resolved Photoluminescence

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 12, Issue 23, Pages 26384-26390

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.0c05539

Keywords

diffusion length; two-dimensional (2D) Ruddlesden-Popper perovskites (RPPs) nanoplatelet; edge-trapping state; time-resolved photoluminescence; surface recombination velocity

Funding

  1. Australian Research Council [DP190103186, DP190103284]
  2. National Natural Science Foundation of China [11604155]
  3. China Scholarship Council [201606930012]

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The diffusion length of photogenerated carriers is a crucial parameter in semiconductors for optoelectronic applications. However, it is a challenging task to determine the diffusion length in layered nanoplatelets due to their anisotropic diffusion of photogenerated carriers and nanometer-thin thickness. Here, we demonstrate a novel method to determine the inplane diffusion length of photogenerated carriers in layered nanoplatelets using local time-resolved photoluminescence. Also, the in-plane carrier diffusion length of 1.82 mu m is obtained for an exfoliated (BA)(2)PbI4 (BA = CH3 (CH2)(3) NH3) perovskite nanoplatelet. This method is particularly useful for weak luminescent materials and the materials that are easily damaged by long-term laser beam because of the high detection sensitivity. This technique is extendable to other layered materials and therefore plays a valuable role in the development and optimization of two-dimensional (2D) and three-dimensional (3D) semiconductor materials and devices for photovoltaic and photonic applications.

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