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Machine learning approaches for ELNES/XANES

Journal

MICROSCOPY
Volume 69, Issue 2, Pages 92-109

Publisher

OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfz109

Keywords

machine learning; ELNES; XANES; first principles simulation

Categories

Funding

  1. Kyoto University Nano Technology Hub under the 'Nanotechnology Platform Project' - Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan
  2. JST-PRESTO [JPM-JPR16NB 16814592]
  3. MEXT [17H06094, 19H00818, 19H05787]
  4. Institute of Industrial Science, University of Tokyo [Tenkai5504850104]
  5. Grants-in-Aid for Scientific Research [19H05787, 19H00818] Funding Source: KAKEN

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Materials characterization is indispensable for materials development. In particular, spectroscopy provides atomic configuration, chemical bonding and vibrational information, which are crucial for understanding the mechanism underlying the functions of a material. Despite its importance, the interpretation of spectra using human-driven methods, such as manual comparison of experimental spectra with reference/simulated spectra, is becoming difficult owing to the rapid increase in experimental spectral data. To overcome the limitations of such methods, we develop new data-driven approaches based on machine learning. Specifically, we use hierarchical clustering, a decision tree and a feedforward neural network to investigate the electron energy loss near edge structures (ELNES) spectrum, which is identical to the X-ray absorption near edge structure (XANES) spectrum. Hierarchical clustering and the decision tree are used to interpret and predict ELNES/XANES, while the feedforward neural network is used to obtain hidden information about the material structure and properties from the spectra. Further, we construct a prediction model that is robust against noise by data augmentation. Finally, we apply our method to noisy spectra and predict six properties accurately. In summary, the proposed approaches can pave the way for fast and accurate spectrum interpretation/prediction as well as local measurement of material functions.

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