Patterned probes for high precision 4D-STEM bragg measurements

Published 2019 View Full Article

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Title
Patterned probes for high precision 4D-STEM bragg measurements
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 209, Issue -, Pages 112890
Publisher
Elsevier BV
Online
2019-11-13
DOI
10.1016/j.ultramic.2019.112890

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