A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging

Title
A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging
Authors
Keywords
-
Journal
PHYSICS LETTERS A
Volume -, Issue -, Pages 126311
Publisher
Elsevier BV
Online
2020-02-06
DOI
10.1016/j.physleta.2020.126311

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