On the Origin for the Hole Confinement into Apertures for GaN-based VCSELs with Buried Dielectric Insulators

Published 2020 View Full Article

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Title
On the Origin for the Hole Confinement into Apertures for GaN-based VCSELs with Buried Dielectric Insulators
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume -, Issue -, Pages -
Publisher
The Optical Society
Online
2020-03-02
DOI
10.1364/oe.385787

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