Process-induced geometric defect sensitivity of Ti–6Al–4V lattice structures with different mesoscopic topologies fabricated by electron beam melting

Published 2020 View Full Article

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Title
Process-induced geometric defect sensitivity of Ti–6Al–4V lattice structures with different mesoscopic topologies fabricated by electron beam melting
Authors
Keywords
-
Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 778, Issue -, Pages 139092
Publisher
Elsevier BV
Online
2020-02-14
DOI
10.1016/j.msea.2020.139092

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