Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors

Title
Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors
Authors
Keywords
-
Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 814, Issue -, Pages 152134
Publisher
Elsevier BV
Online
2019-09-04
DOI
10.1016/j.jallcom.2019.152134

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