Impedance Characteristics and Chip-Parasitics Extraction of High-Performance VCSELs

Title
Impedance Characteristics and Chip-Parasitics Extraction of High-Performance VCSELs
Authors
Keywords
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Journal
IEEE JOURNAL OF QUANTUM ELECTRONICS
Volume 56, Issue 1, Pages 1-11
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-11-16
DOI
10.1109/jqe.2019.2953710

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