4.3 Article

Carrier-storage-enhanced superjunction IGBT with n-Si and p-3C-SiC pillars

Journal

ELECTRONICS LETTERS
Volume 55, Issue 25, Pages 1353-1354

Publisher

INST ENGINEERING TECHNOLOGY-IET
DOI: 10.1049/el.2019.2803

Keywords

silicon compounds; silicon; insulated gate bipolar transistors; wide band gap semiconductors; elemental semiconductors; semiconductor heterojunctions; semiconductor device breakdown; carrier-storage-enhanced superjunction IGBT; carrier-storage-enhanced superjunction insulated gate bipolar transistor; carrier-storage effect; conventional SJ IGBT; p-3C-silicon carbide pillars; n-silicon pillar; turn-off loss; on-state voltage drop; breakdown voltage; field stop IGBT; voltage 0; 35 V; voltage 0; 3 V; voltage 1450; 0 V; voltage 0; 81 V; voltage 1; 22 V; Si-SiC

Funding

  1. National Natural Science Foundation of China [61804101]
  2. China Postdoctoral Science Foundation [2018M643476]

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A carrier-storage-enhanced superjunction (SJ) insulated gate bipolar transistor (IGBT) with n-Si and p-3C-SiC pillars (Si/SiC SJ IGBT) is studied. At the on-state, the n-Si/p-SiC heterojunction acts as a barrier for holes in the n-Si pillar, which helps to enhance the carrier-storage effect in the n-Si pillar and improves the tradeoff between turn-off loss (E-off) and on-state voltage drop (V-CE(sat)). It is found by simulations that V-CE(sat) of the Si/SiC SJ IGBT can be 0.35 V lower than that of the conventional SJ IGBT with the same breakdown voltage (V-B = 1450 V). Under E-off = 5 mJ/cm(2), V-CE(sat) of the Si/SiC SJ IGBT is 1.22 V, which is 0.30 and 0.81 V lower than V-CE(sat) of the conventional SJ IGBT and the field stop IGBT, respectively.

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